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Electron microscopes

Systems  for In-situ experiments

Equipments for making samples
Others for MEMS
           INSTEMS-MT high temperature and high load in situ research system

INSTEMS-MT

   Single or coupled external fields such as force and heat are applied to the material in the millimeter confinement space of transmission electron microscope, and the nano/atomic scale microstructure and properties of the material under multiple external fields (force field and thermal field) are observed in real time through transmission electron microscope.

 

Main pecifications:

Maximum operating temperature:1200℃

Maximum driving force: >100 mN

Maximum drive displacement: ≥4 μm

 
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