Systems  for In-situ experiments

Nanofactory^TM AFM-TEM system

Working load range: 0-2000 nN;
Force sensitivity: 10 nN;
Scanning range: 25 μm×25;
Z-rang: 2.5 μm;
Piezo resolution X, Y: 20 pm;
Piezo resolution Z: 2.5 pm;
AFM modes: contact;
AFM lateral resolution: <15 nm;