Electron microscopes
Systems for In-situ experiments
NanofactoryTM STM-TEM system
Max Current range: 0-5 mA; Max bias range: +/-10 V; Scanning range: 25 μm×25 μm; Z-rang: 2.5 μm ; Piezo resolution X, Y: 20 pm; Piezo resolution Z: 2.5 pm; Operation modes: contact, tunneling; Field emission (bias +/- 140 V);
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