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Electron microscopes

Systems  for In-situ experiments

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           TEM Titan 80-300 Transmission Electron Microscope

     This microscope is widely acknowledged as its ultra-high resolution. STEM, EELS detectors, and energy filters have been embedded into the user interface, making new functions such as HR-STEM imaging, analysis of CBED, NBED, EELS analysis and energy filtered imaging and so on.

Main Specifications:

Acceleration Voltage 80-300 kV
TEM Information Limit :80pm
STEM Resolution :0.14nm
EELS Energy Resolution :.7 eV
Spot drift :0.5nm/min
FEG Probe current 1nm spot :0.6 nA
Specimen drift :0.5nm/min

TITAN 80-300 TEM

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